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Oral Candidacy - Yue Ma

Start: 5/18/2017 at 2:00PM
End: 5/18/2017 at 5:00PM
Location: 258 Fitzpatrick
Attendees: Faculty and students are welcome to attend the presentation portion of the defense.
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Yue Ma

Oral Candidacy

May 18, 2017          10:00 pm          258 Fitzpatrick

Adviser: Dr. Sharon Hu


Dr. Robert Dick        Dr. Michael Niemier        Dr. Yiyu Shi



“Improving reliability for real-time embedded systems”.


Multicore embedded systems offer good performance with reasonable power consumption and are widely used in many real-time applications such as automotive electronics, industrial automation, and avionics. Ongoing increases in device densities and operating frequencies increase microprocessor power density and temperature. This increased chip temperature accelerates the aging of devices, resulting in permanent faults and reducing operating lifespans. Since many real-time embedded systems are used in critical applications and may be expensive as well as difficult to replace, lifetime reliability due to permanent faults is an important design consideration. Meanwhile, decreased feature size and operating voltage and frequency make the circuit more vulnerable to transient faults, thus degrade soft-error reliability. Transient fault is the temporary malfunction of processors and caused by cosmetic ray radiations that lead to temporary errors in data and computations. Soft errors that result from transient faults become more frequent with low core voltage and frequency, and an increasing concern for system design.

To reduce the cost of repairing/replacing an entire system and maintain quality of service, improving lifetime reliability and soft-error reliability becomes a major design concern in current computer systems, especially for embedded systems deployed in harsh environments. However, techniques for reducing power, energy, and/or temperature to improve lifetime reliability, however, reduce soft-error reliability, and vice versa. Hence, the method to improve a system's reliability should consider this lifetime reliability and soft-error reliability tradeoff. In this proposal, we first summarize our contributions in improving reliability for real-time embedded systems and then introduce research directions in our future work.